The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2004
Filed:
Feb. 25, 2000
Michael S. Phillips, Belmont, MA (US);
Krishna K. Govindarajan, Somerville, MA (US);
Mark Fanty, Norfolk, MA (US);
Etienne Barnard, Somerville, MA (US);
SpeechWorks International, Inc., Boston, MA (US);
Abstract
A telephone-based interactive speech recognition system is retrained using variable weighting and incremental retraining. Variable weighting involves changing the relative influence of particular measurement data to be reflected in a statistical model. Statistical model data is determined based upon an initial set of measurement data determined from an initial set of speech utterances. When new statistical model data is to be generated to reflect new measurement data determined from new speech utterances, a weighting factor is applied to the new measurement data to generate weighted new measurement data. The new statistical model data is then determined based upon the initial set of measurement data and the weighted new measurement data. Incremental retraining involves generating new statistical model data using prior statistical model data to reduce the amount of prior measurement data that must be maintained and processed. When prior statistical model data needs to be updated to reflect characteristics and attributes of new speech utterances, statistical model data is generated for the new speech utterances. Then the prior statistical model data and the statistical model data for the new measurement data are processed to generate the new statistical model data.