The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2004

Filed:

Apr. 04, 2001
Applicant:
Inventor:

Toshihiro Hirai, Osakasayama-shi, Osaka, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

A clinical-examination-numeral-data-processing system is constituted in which a plurality of laboratory observed values presented by items are transformed into positive and negative finite integers making observed values, including limitless values, the unit inside the interval of boundary values decided arbitrarily and they are ranked and processed according to the degree of importance on diagnosis, and it is made possible to perform transformation process for transforming a plurality of laboratory observed data presented by items being expressed by different units into the data being expressed with a comparable standardized unit, and to compose the transformed values of laboratory observed values to a list by examination items.


Find Patent Forward Citations

Hirai, Toshihiro. (2004). Clinical-examination-numerical-data-processing system and recording medium for diagnostic program using the system (U.S. Patent No. 6789019). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6789019

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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