The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2004
Filed:
Feb. 03, 1999
Toshio Norita, Osaka, JP;
Takashi Kondo, Sakai, JP;
Eiro Fujii, Takatsuki, JP;
Fumiya Yagi, Toyonaka, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
Method and apparatus for measuring three dimensional information of a target placed in an interior space of a rotator type mirror by using the rotator type mirror in combination with an imaging apparatus disposed with its light receiving axis aligned with a center axis of the rotator type mirror. The invention includes projecting reference light toward the rotator type mirror from a position on the center axis, and scanning the target with mirror reflected reference light that is produced by reflecting the reference light on the rotator type mirror. The invention further includes obtaining the three dimensional information of the target, based on a physical quantity corresponding to the projection angle of the reference light and on a physical quantity corresponding to the position of a projected image obtained when the mirror reflected reference light that scanned the target is captured by the imaging apparatus via the rotator type mirror.