The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2004
Filed:
Aug. 09, 2002
Johannes Catharina Antonius Op De Beek, Eindhoven, NL;
Reiner Koppe, Hamburg, DE;
Erhard Paul Artur Klotz, Nuemuenster, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An X-ray examination apparatus includes an X-ray source and an X-ray detector and is arranged to provide a series of projection images at respective orientations of the X-ray source ( ) and the X-ray detector ( ) relative to a predetermined frame of reference. The orientations of the projection images are calibrated relative to this frame of reference. A basic three-dimensional data set ( ) is reconstructed from the projection images. A number of directions of observations ( ) are calibrated relative to the same frame of reference. One or more additional X-ray images ( ) are formed for the calibrated directions of observation, that is, preferably at successive instants in time. A dynamic series of three-dimensional data sets is formed by updating the basic three-dimensional data set by means of the additional X-ray images.