The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2004

Filed:

Jan. 29, 2002
Applicant:
Inventor:

Serge Dubovitsky, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

The present invention relates to a heterodyne interferometer system with a pre-processing of the target signal to isolate and remove self-interference signals using a known phase modulation of the carrier signal's frequency. Where self-interference signals do not include a time delay inherent in the target signal that travels to the target reflector, by selecting a modulation frequency tuned to the time delay and then filtering the resultant signal the target beam can be isolated and the self-interference signal can be effectively removed The system includes a modulation unit to apply a phase modulation to the carrier signal, and a mixing unit that demodulates the target signal at the modulation frequency to isolate the target beam.


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