The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2004
Filed:
May. 22, 2002
Fred J. Reuter, Plano, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method and apparatus for measuring the transient behavior characteristics of individual micromirrors in a DMD micromirror array. The method and system use sampling techniques to measure an amount of light reflected by an individual micromirror as the entire micromirror array is stimulated with a pattern of alternating driving signals. Sampling is achieved by illuminating the DMD micromirror array with a high-speed illumination source that provides stroboscopic light flashes of very short time length. By synchronizing the light flashes with the mirror driving signal and measuring the amount of light reflected by the individual micromirrors at different points in time, the transient behavior characteristics of individual micromirrors in a DMD micromirror array can be measured with a high level of accuracy.