The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 2004
Filed:
Jun. 13, 2001
Applicant:
Inventors:
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/141 ;
U.S. Cl.
CPC ...
G01N 2/141 ;
Abstract
A method of reducing the effects of varying environmental conditions on a measuring instrument includes thermally insulating a measuring unit such that the effects of variations of environmental conditions on selected components of the measuring unit are substantially reduced, while allowing dissipated heat generated within the measuring unit to leave the measuring unit. The method also includes controlling a first temperature in the measuring unit by means of a control loop which includes a temperature sensor and means to influence the first temperature in the measuring unit in such a way that temperatures at locations with selected components are kept substantially constant.