The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2004

Filed:

Dec. 30, 1999
Applicant:
Inventors:

Zhiliang Julian Chen, Plano, TX (US);

Eugene G. Dierschke, Dallas, TX (US);

Steven Derek Clynes, Allen, TX (US);

Anli Liu, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/235 ;
U.S. Cl.
CPC ...
H04N 5/235 ;
Abstract

Image enhancement is automatically achieved by calibrating the reference voltage and gain of a differential amplifier and the integration interval so as to provide an input to a differential analog to digital converter (ADC) that utilizes the full dynamic range of the ADC. When used with a CMOS array, the imaging logic can be fabricated on a single chip with the array using combinational logic for fast, inexpensive calibration. Another advantageous feature is the ability to expand a desired portion of the luminance spectrum of the image in order to increase the digital resolution of the resulting image for that portion of the spectrum of interest.


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