The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 2004

Filed:

Jan. 16, 2001
Applicant:
Inventors:

Macmillan M. Wisler, Kingwood, TX (US);

Larry W. Thompson, Willis, TX (US);

LucVan Puymbroeck, Kingwood, TX (US);

Holger Stibbe, Humble, TX (US);

Hallvard S. Hatloy, Nienhagen, DE;

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/08 ; E21B 4/902 ;
U.S. Cl.
CPC ...
G01V 3/08 ; E21B 4/902 ;
Abstract

A highly accurate, fully compensated, high spatial resolution, wave propagation system for measuring dielectric constant and resistivity of fluids or solids in a cylindrical enclosure and method for measuring well core characteristics in-situ or in a laboratory. One embodiment of the invention relies on waves propagated from transmitters above and below two spaced receivers which transmit and receive electromagnetic waves via slots on the inner periphery of a cylinder structure. The data is then processed with a CPU either down hole for later retrieval or on the surface for real-time monitoring.


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