The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6787364 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 07, 2004

Filed:

May. 02, 2001
Applicant:
Inventors:

Haruo Tajima, Nagoya, JP;

Hidekatsu Yoneda, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/100 ;
U.S. Cl.
CPC ...
G01N 3/100 ;
Abstract

A sample chip analyzing device includes a waveguide plate which entirely reflects and guides incident light and has a number of sampling probes that are connectable to a sample to be analyzed, a light source which irradiates fluorescent pumping light onto an end face of an end portion of the waveguide plate that is inserted into a light-shielding box, and a pickup member which picks up an image of substantially an entire surface of the waveguide plate. The sample to be analyzed is labeled with fluorescent substances that are fluorescence-pumped by an evanescent wave which occurs when the fluorescent pumping light enters into an interior of the waveguide to be entirely reflected and guided, and the sample is analyzed by detecting respective ones of the sampling probes that are coupled to the fluorescence-pumped flourescent substances of the labeled sample, based on data outputted by the pickup member.


Find Patent Forward Citations

Tajima, Haruo. (2004). Sample chip analyzing device and method for analyzing the same (U.S. Patent No. 6787364). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6787364

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