The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Aug. 07, 2000
Yun Lu, Troy, MI (US);
Russell J Navarre, Farmington Hills, MI (US);
Li Zhang, Rochester Hills, MI (US);
DaimlerChrysler Corporation, Auburn Hills, MI (US);
Abstract
The present invention provides a method for evaluating a surface quality of a simulated stamping which includes the steps of obtaining a CAD model of a desired part, calculate and display at least one image of true reflect line on the CAD model, obtaining a blank mesh representative of the part before the part is formed, and processing the blank mesh with a springback simulation software to obtain a deformed finite element analysis springback blank. True reflect lines are then calculated and displayed on the deformed FEA springback blank, and the reflect lines are compared with the true reflect lines on the CAD model to determine variance of the deformed springback blank with the CAD model.