The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2004

Filed:

May. 29, 2003
Applicant:
Inventor:

Yaohui Zhang, Katy, TX (US);

Assignee:

PGS Americas, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/00 ;
U.S. Cl.
CPC ...
G01V 1/00 ;
Abstract

A method of updating velocity whereby corresponding reflections are identified from P-P and P-S near-offset waves received from a seismic source and reflected by a subsurface layer to form P-P and P-S depth consistent image gathers. A joint velocity inversion in depth is performed on the P-P and P-S depth consistent image gathers to estimate a vertical depth z , vertical P-wave velocity v , and vertical S-wave velocity v of the subsurface layer. An isotropic depth migration of P-P depth consistent image gathers is determined based upon the depth z , P-wave velocity v , and S-wave velocity v to estimate a vertical isotropic depth z of the subsurface layer. Anisotropic parameters &dgr; and &sgr; are calculated based upon the depth z , P-wave velocity v , and S-wave velocity v . The above steps are repeated, beginning with the joint velocity inversion, until the P-wave velocity v and S-wave velocity v are substantially unchanged.


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