The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2004

Filed:

Nov. 30, 1999
Applicant:
Inventor:

James Wichelman, Fort Collins, CO (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 7/20 ;
U.S. Cl.
CPC ...
H04Q 7/20 ;
Abstract

A channel plan with a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan has one or more predefined specifications for each of one or more signal channels on each of the nodes. The channel plan enables a monitoring system to, among other things, conduct automatic periodic test plans, comprising tests, on the nodes, based upon the predefined data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes as a whole and/or to one or more channels contained within the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller controlling the switch and the spectrum analyzer. The controller is configured to enable creation of and display the channel plan and test plan, based upon user inputs. Notably, the controller also implements user friendly configuration interface logic that enables a user to configure the test plan. The configuration interface logic generates, among other things, on a display screen, a device configuration interface, a channel plan configuration interface, a test plan configuration interface, and a configuration display interface that includes a number of navigational mechanisms that are manipulated to display one of the device, channel plan, and test plan configuration interfaces.


Find Patent Forward Citations

Wichelman, James. (2004). Monitoring system and method implementing test configuration logic (U.S. Patent No. 6785540). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6785540

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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