The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Nov. 05, 2002
Martin Annis, Cambridge, MA (US);
Other;
Abstract
A personnel x-ray inspection system includes an electron source that provides a pencil beam of electrons. An electromagnet assembly receives the pencil beam of electrons and directs the beam of electrons along a line to form a scanning redirected beam under the control of a scan command signal. The scanning redirected beam strikes a target and generates a cone of x-rays that moves along a target line as a result of the scanning redirected beam. A collimator receives the scanning cone of x-rays and generates a collimated traveling pencil beam, which is directed to a person under inspection. A moving platform translates the person under inspection through the collimated traveling pencil beam. A backscatter detector detects backscattered x-rays, and provides a backscattered detected signal indicative thereof. A system controller provides the scan command signal, and also receives and processes the backscattered detected signal.