The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Apr. 24, 2000
Applicant:
Inventors:
Yuichi Noda, Kanagawa, JP;
Takayuki Kamikura, Kanagawa, JP;
Assignee:
The Yokohama Rubber Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/184 ;
U.S. Cl.
CPC ...
G01N 2/184 ;
Abstract
It is an object of the present invention to provide a sheet-material foreign-matter detecting method and apparatus capable of securely detecting foreign matter attached to a sheet material. That is, the foreign matter attached to the sheet material is detected by applying light emitted from a light source to a sheet material, by picking up a light-source image reflected to the surface of the sheet material by image pickup means, and by judging a difference between brightnesses of a reflected image due to a difference between reflectances of the sheet material and the foreign matter.