The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Jul. 17, 2002
Applicant:
Inventors:
Rajagopal Vijayakumar, Liverpool, NY (US);
Sylvain Dominique Masset, Seigy, FR;
Assignee:
Hamilton Associates, Inc., Owings, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/101 ; G01J 3/114 ;
U.S. Cl.
CPC ...
G01N 2/101 ; G01J 3/114 ;
Abstract
An analyzing probe for insertion into numerous different environments to determine at least one characteristic of particulate matter suspended in a fluid stream of a test sample. Preferably, the analyzing probe includes a minimal amount of optical elements such as lenses that are subjected to the conditions of the environment of the fluid stream to be tested. Further, the analyzing probe is preferably designed so that it can be readily manufactured, operated and installed by relatively unskilled laborers.