The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Mar. 09, 2000
Jarmo Korpi, Nousiainen, FI;
Donal Denvir, Belfast, GB;
Wallac Oy, Turku, FI;
Abstract
This invention relates generally to the processing of measured data. Especially the invention applies to the binning procedure of data which is measured with a CCD (Charge-Coupled Device) sensor unit. The invention is preferably used in photometrics for measuring radiation from samples on a well plate. It is the objective of the present invention to create a solution, in which a good signal-to-noise value is achieved, and the measuring results of the neighbouring sample wells can still be well separated. This objective is achieved in photometrics application by selecting the binning factor on the basis of position and size of sample wells on a well plate ( ). With the present invention it is possible to achieve a maximal signal-to-noise ratio, because all pixels within the image area of one sample are accumulated. However, since the pixels between the sample images are not accumulated with the pixels within the sample images ( ), the problem of interference between samples can be avoided.