The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2004

Filed:

May. 18, 2001
Applicant:
Inventors:

Michael W. Schimpf, Pacific Grove, CA (US);

Michael G. Lavelle, Saratoga, CA (US);

Mark E. Pascual, San Jose, CA (US);

Nandini Ramani, Saratoga, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/500 ;
U.S. Cl.
CPC ...
G06T 1/500 ;
Abstract

A graphics system configured to operate on a collection of vertices to determine mappings from an initial order to secondary and tertiary ordering. The initial order corresponds to the ordering of the vertices in an input buffer. The secondary (tertiary) ordering corresponds to the ordering of the vertices along a triangle major (minor) axis. The graphics system computes horizontal and vertical displacements along edges of the triangle in the initial ordering, and uses the signs of the horizontal displacements and vertical displacements to access a mapping table which determines the mappings. The mappings may be used to rasterize the triangle in terms of pixels (or samples).


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