The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Aug. 21, 2002
John Harold Meloling, San Diego, CA (US);
David Earl Hurdsman, La Mesa, CA (US);
Wendy Marie Massey, San Diego, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A dual-chambered anechoic chamber used in conjunction with spatial averaging for making transmission measurements of electromagnetic devices. The anechoic chamber includes a first tapered chamber with a first aperture, a second tapered chamber with a second aperture opposed to the first aperture, an alignment apparatus for aligning the two chambers and, if necessary, for positioning a test device between the apertures, and a positioning mechanism for mounting and determining the position of a transmitter antenna. A receiver antenna in the second chamber receives test signals transmitted from the transmitter antenna. At selected transmitter antenna positions, measurements are taken at different frequencies. For each transmitter position, a measurement is made with the test device positioned between the apertures, and another without the test device. When all desired measurements have been made, the measurement data are spatially averaged; i.e., the measurements are scaled, summed, and averaged, providing a more accurate transmission measurement.