The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2004

Filed:

Oct. 29, 2001
Applicant:
Inventors:

John F. Rabolt, Greenville, DE (US);

Mei-Wei Tsao, Wilmington, DE (US);

Assignee:

UD Technology Corporation, Newark, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/135 ;
U.S. Cl.
CPC ...
G01N 2/135 ;
Abstract

An apparatus and method capable of providing IR spectral information using IR absorption phenomena requires no moving parts or Fourier Transform during operation. IR spectral information and chemical analysis of a sample in a sample containing functional groups is determined by using an IR source, a sampling accessory for positioning the sample volume, an optically dispersive element, a focal plane array (FPA) arranged to detect the dispersed light beam, and a processor and display to control the FPA, and display an IR spectrograph. Fiber-optic coupling allows remote sensing, and portability, reliability, and ruggedness is enhanced due to the no-moving part construction. Use of the apparatus and method has broad industrial and environmental application, including measurement of thickness and chemical composition of various films, coatings, and liquids, and may also be used in real-time sensing of hazardous materials, including chemical and biological warfare agents.


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