The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Apr. 24, 2002
Ken C. K. Cheung, Kailua, HI (US);
Ronald J. Hugo, Calgary, CA;
Oceanit Laboratories, Inc., Honolulu, HI (US);
Abstract
A two-dimensional array of lateral-effect detectors (or position-sensing devices) is used to simultaneously measure multi-point centroidal locations at high speed. It is one of the primary components of a high-speed optical wavefront sensor design comprising a Shack-Hartmann-type lenslet array and associated analog circuitry including analog-to-digital (A/D) converters, and digital micro-processors. The detector array measures the centroidal location of each incident beam emerging from the lenslet array and calculates the local wavefront slope based on the beam deviations from their respective subaperture centers. The wavefront sensor is designed for high temporal bandwidth operation and is ideally suited for applications such as laser-beam propagation through boundary-layer turbulence, atmospheric turbulence, or imperfect optics. The wavefront sensor may be coupled with a deformable mirror as primary components of an adaptive optics system.