The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Sep. 24, 2002
Applicant:
Inventors:
Hans-Ludwig Althaus, Lappersdorf, DE;
Joachim Reill, Zeitlarn, DE;
Karl-Heinz Schlereth, Burglengenfeld, DE;
Assignee:
Infineon Technologies AG, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/36 ; G02B 6/34 ;
U.S. Cl.
CPC ...
G02B 6/36 ; G02B 6/34 ;
Abstract
An optical for wavelength reference measurement has in essence an optical conductor with integrated fiber Bragg grating that has a transmission maximum at a desired wavelength. Arranged downstream of the fiber Bragg grating is a photoreceiver receiving the measuring radiation beam passing through the fiber Bragg grating. If desired, it is possible to use a beam splitter to produce a reference radiation beam that is detected in a further photoreceiver.
Althaus, Hans-Ludwig. (2004). Optical module for wavelength reference measurement in wdm systems (U.S. Patent No. 6783284). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6783284
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile