The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2004

Filed:

Mar. 30, 1999
Applicant:
Inventors:

Tushar Deepak Chandra, New York, NY (US);

Sameh Afif Fakhouri, New Rochelle, NY (US);

Liana Liyow Fong, Irvington, NY (US);

William Francis Jerome, Amawalk, NY (US);

Srirama Mandyam Krishnakumar, Mont Kisco, NY (US);

Vijay Krishnarao Naik, Yorktown Heights, NY (US);

John Arthur Pershing, Jr., Buchanan, NY (US);

John Joseph Edward Turek, South Nyack, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/46 ;
U.S. Cl.
CPC ...
G06F 9/46 ;
Abstract

The number of instances of an application running in a computing environment are controlled by monitoring the current load on the application, and altering the current number of instances of the application based on results of the monitoring. The load may be monitored by monitoring the current number of instances of the application running in the computing environment. Where a maximum, minimum and/or initial number on startup, of instances of the application are specified, the altering is done based on comparing the current number to one or more of the specified numbers of instances.


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