The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2004
Filed:
Jun. 07, 2002
Lawrence J. LeGore, Freedom, ME (US);
Robert H. Jackson, III, Veazie, MA (US);
Zhong Yu Yang, Old Town, ME (US);
Linda K. DeNoyer, Ithaca, NY (US);
Peter H. Kleban, Orono, ME (US);
Brian G. Frederick, Orono, ME (US);
Other;
Abstract
A spectroscopy instrument that uses spectra produced from random binary sequence modulated data. Statistical estimation techniques are used to achieve resolution enhancement, while properly accounting for the Poisson noise distribution and other artifacts introduced by a modulator or “chopper” or other system components. Indeed, a resolution similar to that of modern spectrometers can be achieved with a dramatic performance advantage over conventional, serial detection analyzers. Both static and dynamic behaviors are theoretically or measured experimentally accounted for in the model as determined. In one embodiment, the finite penetration of the field beyond the plane of the chopper leads to non-ideal chopper response, which is characterized in terms of an “energy corruption” effect and a lead or lag in the time at which the beam responds to the chopper potential.