The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2004
Filed:
Apr. 01, 2003
Peggi J. Eller, Endicott, NY (US);
Robert M. Krohn, Ithaca, NY (US);
Douglas N. McMartin, Apalachin, NY (US);
Steven J. Pratt, Endwell, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
Methods and systems for calibrating and aligning Time Delay Integration (TDI) Charge Coupled Device (CCD) sensors. A TDI sensor for linear imaging (line sensor) is calibrated by generating a two dimensional image from the line sensor, analyzing the two dimensional image, and calibrating the line sensor based on the analysis. An alignment correction can then be generated, the correction applied to the line sensor placement and the line sensor re-tested. A calibration system includes means for generating a two dimensional image from the TDI line sensor, means for analyzing the two dimensional image, and means for calibrating the line sensor based on the analysis of the two dimensional image.