The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2004

Filed:

Jun. 20, 2002
Applicant:
Inventors:

Hitoshi Hatayama, Yokohama, JP;

Chisai Hirose, Yokohama, JP;

Masayuki Nishimura, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/26 ;
U.S. Cl.
CPC ...
G02B 6/26 ;
Abstract

The invention provides an apparatus for and method of monitoring wavelength multiplexed signal light, which can obtain monitored data for multi-channel optical signals contained in the wavelength multiplexed signal light, which can avoid a large size and complicated structure and high cost of monitoring apparatus, and which can easily monitor the wavelength multiplexed signal light. The invention also provides an optical transmission system employing the monitoring apparatus and method. An optical filter being able to control a loss pattern is disposed on a monitoring waveguide for the wavelength multiplexed signal light, which is branched for monitoring from an input waveguide and an output waveguide constituting a main optical transmission path in a wavelength multiplexed signal light monitoring apparatus. While the optical filter sets a plurality of loss patterns in sequence, the wavelength multiplexed signal light having passed through the optical filter is detected by a photodiode for each of the loss patterns, and monitored data of the wavelength multiplexed signal light can be obtained from detected data.


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