The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2004
Filed:
Apr. 05, 2002
Applicant:
Inventors:
Akira Nanba, Kato, JP;
Kenichi Hamada, Kato, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 ;
U.S. Cl.
CPC ...
G11B 5/09 ;
Abstract
A data reproduction apparatus that employs an expected value generation unit that employs a maximum likelihood decoding algorithm, thereby an expected value is correctly determined from a histogram of sampled values of a signal to be reproduced, even when an offset arises in the signal to be reproduced, the offset being removed from the sampled values used in generating a histogram that is used to determine the expected value.
Nanba, Akira. (2004). Expected value generation unit and a data reproduction apparatus (U.S. Patent No. 6781938). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6781938
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile