The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2004
Filed:
Nov. 29, 2000
Karl A. Belser, San Jose, CA (US);
Li-Ping Wang, Fremont, CA (US);
Terry W. McDaniel, Morgan Hill, CA (US);
JPMorgan Chase Bank, New York, NY (US);
Abstract
Marks with curved edges are used in data patterns and sensed with proximity recording. Circular, elliptical, and oval marks are examples of marks with curved edges that can be used in the present invention. The marks with curved edges are used to define data patterns (e.g. position error signal patterns) as a function of radius. If the marks with curved edges have been recorded longitudinally, an amplitude of a read back signal, such as a peak amplitude, is determined in order to generate a position error signal. If the marks with curved edges have been recorded vertically, an area under the curve of the read back signal is determined in order to generate a position error signal.