The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2004
Filed:
May. 28, 2002
Applicant:
Inventors:
Antonios Giannakopoulos, Athens, GR;
Subra Suresh, Wellesley, MA (US);
Ares J. Rosakis, Altadena, CA (US);
Ilan Blech, Los Altos, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/130 ;
U.S. Cl.
CPC ...
G01B 1/130 ;
Abstract
Techniques for determining large deformation of layered or graded structures to include effects of body forces such as gravity, electrostatic or electromagnetic forces, and other forces that uniformly distribute over the structures, support forces, and concentrated forces. A real-time stress monitoring system is also disclosed to provide in-situ monitoring of a device based on the large deformation analytical approach. A coherent gradient sensing module, for example, may be included in such a system.