The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2004
Filed:
Sep. 09, 2002
Xudong Fan, Austin, TX (US);
James F. Brennan, III, Austin, TX (US);
Michael R. Matthews, Austin, TX (US);
Pranay G. Sinha, Columbia, MD (US);
Jerome C. Porque, Austin, TX (US);
3M Innovative Properties Company, St. Paul, MN (US);
Abstract
A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase &phgr; of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase &phgr; of the optical component using a scanning laser having a scanning step size &Dgr;&ohgr; and a modulation frequency &ohgr; such that &Dgr;&ohgr;/&ohgr; . The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency &ohgr; is constructed where H(&ohgr;)=R(&ohgr;)exp[j&phgr;(&ohgr;)], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.