The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2004
Filed:
Dec. 21, 2000
Applicant:
Inventors:
Nadim Joni Shah, Linnich, DE;
Karl Zilles, Köln, DE;
Assignee:
Forschungszentrum Jülich GmbH, Jülich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract
The present invention relates to a process for examining an object, whereby properties of the object are detected at different times within a spatial frequency space formed by spatial frequencies. The process is carried out in such a way that consecutive images are recorded in overlapping areas of the spatial frequency space and, additionally, in areas of the spatial frequency space that differ from each other.