The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2004

Filed:

Jun. 08, 2001
Applicant:
Inventors:

Lawrence B. Wolff, New York, NY (US);

Marvin Hutt, Oakland, NJ (US);

Assignee:

Equinox Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/500 ;
U.S. Cl.
CPC ...
H01L 2/500 ;
Abstract

A sensor fusion system simultaneously acquires at least two images in a subspectrum of the visible/NIR/SWIR (0.4-2.0 micron) reflective spectrum and in a subspectrum of the thermal infrared (3.0-15 micron) spectral regions using respective sensing arrays viewing a common aperture. Although sensed by separate focal plane arrays, radiation enters at the front-end of a commonly shared focusing optical system so that all sensed radiation originates along exactly the same optical path and then is directed to each sensing plane. This provides precise co-registration of reflective and thermal infrared imagery regardless of the depth-of-field range of the scene being imaged, and enables the precise integration of image fusion processing and algorithms to fully exploit the complementary properties of reflected and thermally emitted radiation from a scene.


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