The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
Jun. 27, 2000
Terry M. Laviolette, Courtice, CA;
Ara Tatous, Los Altos, CA (US);
ATI International SRL, Christchurch, BB;
Abstract
A software test system and method detects a hardware configuration of each of plurality of test stations that are coupled to a processor such as a test center server. The software test system and method stores hardware configuration data representing the detected hardware configuration of each of the plurality of test stations and provides the hardware configuration data for use in determining which of the plurality of test stations is a suitable test station for testing target software to be tested. The test stations are dynamically configurable to contain and operate differing operating systems, test software, software to be tested and other suitable applications. A plurality of test stations coupled to a test center server each have different hardware configurations. The software test system and method provides selectability of test station configuration data such as selectable data including differing operating systems, different target software to be tested on at least one of the plurality of test stations and differing test software capable of testing the selected target software to be tested.