The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
Apr. 02, 2002
Applicant:
Inventors:
Allen Curtis Cekorich, Northridge, CA (US);
Ira Jeffrey Bush, Los Angeles, CA (US);
Assignee:
Optiphase, Inc., Van Nuys, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/42 ;
U.S. Cl.
CPC ...
G02B 6/42 ;
Abstract
An apparatus and method is presented presented to provide wide dynamic range measurements of the input phase to a time domain multiplex interferometer array using a dual slope modulation method for interrogation. Features of the present invention include a topology capable of using only single mode fiber components and self-correcting processing approaches that reduce measurement errors providing high accuracy measurements and significantly reducing the cost of interrogation.
Cekorich, Allen. (2004). Dual slope fiber optic array interrogator (U.S. Patent No. 6778720). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6778720
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile