The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
Oct. 04, 2000
Kenji Okajima, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
In a feature extracting device for pattern recognition which is hardly affected by a pattern variation, an input pattern received by a learning pattern input/store unit is normalized by a normalizing unit and projected on a subspace group by a feature vector extracting unit, so to calculate feature vectors from each projection length, and a parameter updating unit updates basis vectors of each subspace so as to increase the ratio (variation between classes/variation within a class) as for the feature vectors, and optimizes them in a way of absorbing the pattern variation into each subspace according as the learning by the update processing progresses, thereby realizing the high ratio of the variation between classes to the variation within a class at the time of completing the learning and enabling the feature extraction more suitable for pattern recognition.