The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
Oct. 17, 2000
Michael H. Myers, Poway, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
An apparatus for and a method of determining the envelope of a complex baseband signal having an in-phase component I and a quadrature component Q by determining (I +Q ) for sampled values of the baseband signal. The maximum and minimum values of I and Q are detected by detecting the larger of I and Q in a first detection circuit ( ) and the smaller of I and Q in a second detection circuit ( ). A value x=½{(the detected minimum value)÷(the detected maximum value)} is calculated in a first calculation circuit ( ). The value of (I +Q ) is then calculated based on the value of x. In a first embodiment the value of (I +Q ) is calculated in a second calculation circuit ( ) as the (the detected maximum value)×(1+x)/2+½(1+x−x +x −x +x −x ). In a second embodiment, the value of (I +Q ) is calculated in a second calculation circuit ( ) as (the detected maximum value)×(1+2x+x /2)÷(1+x). Preferably, the apparatus is implemented in a gate array, such as a field programmable gate array, providing high speed operation.