The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
Jun. 01, 2000
Gregory P. Crawford, Providence, RI (US);
Darran R. Cairns, Providence, RI (US);
Christopher C. Bowley, Woodbury, MN (US);
Sorasak Danworaphong, Providence, RI (US);
Adam K. Fontecchio, Medfield, MA (US);
Sadeg M. Faris, Pleasantville, NY (US);
Le Li, Yorktown Heights, NY (US);
Other;
Abstract
A reflective strain gauge includes an holographically-formed polymer dispersed liquid crystal (H-PDLC) film comprising layers of liquid crystal (LC) droplets in a matrix polymer, the H-PDLC film having a reflection or transmission grating capable of reflecting or transmitting light of a selected wavelength, and means for adhering the film to a surface of a workpiece for monitoring the strain at said surface. A change in the nature of the reflected light is an indication of strain. Also included is a polarizing material having an holographically-formed polymer dispersed liquid crystal (H-PDLC) film comprising layers of liquid crystal (LC) droplets in a matrix polymer, the H-PDLC film having a reflection grating capable of reflecting light of a selected wavelength, wherein the reflection grating of the H-PDLC film is oriented, such that the refractive index parallel to said axis of orientation (n ) is greater than the refractive index perpendicular to said axis (n ).