The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
May. 18, 2001
Applicant:
Inventors:
Gun Hee Lee, Kyongsangbuk-do, KR;
Wi Jin Nam, Kyongsangbuk-do, KR;
Assignee:
LG.Philips LCD Co., Ltd., Seoul, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/36 ;
U.S. Cl.
CPC ...
G09G 3/36 ;
Abstract
A method for examining quality of a flat panel display device is disclosed, in which good/fail of the flat panel display device is automatically examined to improve efficiency of the operation and obtain exact examined result. The method for examining good/fail of a flat panel display device includes the steps of inputting defect data for each process step, automatically examining good/fail of the panel depending on the input defect data, and measuring good/fail and yield of a glass based on the examined result of the panel.