The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
Jul. 24, 2002
Applicant:
Inventors:
Mihoko Akiyama, Hyogo, JP;
Akira Yamazaki, Hyogo, JP;
Fukashi Morishita, Hyogo, JP;
Yasuhiko Taito, Hyogo, JP;
Nobuyuki Fujii, Hyogo, JP;
Mako Okamoto, Hyogo, JP;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/358 ; H02J 1/982 ;
U.S. Cl.
CPC ...
H01L 2/358 ; H02J 1/982 ;
Abstract
A VDC circuit that supplies an internal voltage VDD to an internal circuit in a normal operation forces a transistor off in a burn-in test mode through input of a test signal to suppress supply of an external power supply voltage VDDH to a node. In a burn-in test mode, an external power supply voltage lower than external power supply voltage VDDH and higher than internal voltage VDD is supplied from an external pad.
Akiyama, Mihoko. (2004). Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing (U.S. Patent No. 6777707). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6777707
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile