The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
May. 20, 2003
Applicant:
Inventor:
Jiten Sarathy, Atlantic Highlands, NJ (US);
Assignee:
Alphion Corporation, Eatontown, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/166 ; G01R 3/126 ;
U.S. Cl.
CPC ...
H01L 2/166 ; G01R 3/126 ;
Abstract
A method of efficiently testing optical chips while still on the wafer is presented. One or more gutters for each chip on the wafer is provided, and either (1) a test signal is applied to the gutter to generate a response from the chip; or (2) a test signal is applied to the chip to generate a response from the gutter, where the gutter is in optical communication with the chip, and can reflect light incident or outgoing light at substantially a ninety degree angle.