The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2004

Filed:

Jul. 23, 2001
Applicant:
Inventors:

Christopher W. Lindsey, Aliso Viejo, CA (US);

George K. Shibata, Upland, CA (US);

Songtai Tu, Yorba Linda, CA (US);

Steven D. Mack, Mira Loma, CA (US);

Dang M. Ngo, Fountain Valley, CA (US);

Assignee:

Beckman Coulter, Inc., Fullerton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/502 ;
U.S. Cl.
CPC ...
G01N 3/502 ;
Abstract

A workstation for integrating two or more automated analyzers. The workstation includes a sample rack handler assembly, having a single common sample rack input area for loading sample racks for the two or more automated analyzers, and a sample rack bypass area for passing sample racks to be processed by one of the two or more automated analyzers. The workstation also includes a sample aliquoting assembly, having a sample pipetter station for aliquoting samples into aliquot vessels for processing by another one of the two or more automated analyzers. The workstation further includes an internal shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the sample pipetter station, and an external shuttle for shuttling the sample racks between the sample rack input area, the sample rack bypass area, and the one of the two or more automated analyzers. In addition, the workstation includes a pick-and-place mechanism for transporting the aliquot vessels between the sample pipetter station and the other one of the two or more automated analyzers. A single common control console is provided for the workstation and the two or more automated analyzers.


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