The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
Feb. 12, 2003
Applicant:
Inventors:
Yoshitsugu Uchino, Shinagawa-ku, JP;
Hidehiko Yamasaki, Shinagawa-ku, JP;
Kazuaki Takahashi, Ageo, JP;
Assignee:
Mitsui Mining & Smelting, Co., Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
C09K 3/14 ;
U.S. Cl.
CPC ...
C09K 3/14 ;
Abstract
The present invention provides a method of examining quality of cerium-based abrasives which can simply determine their grinding characteristics. Specifically, the method employs X-ray diffractometry to examine qualities based on, for example, B/A wherein A and B are peak intensities relevant to Ln O and LnF , respectively. The present invention further provides: a method of producing a cerium-based abrasive which can give cerium-based abrasive with specific grinding characteristics; and a cerium-based abrasive which has specific grinding characteristics for specific purposes.