The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2004

Filed:

Sep. 12, 2002
Applicant:
Inventors:

Nihal Wijeyesekera, Stafford, TX (US);

Thomas Little, Kingwood, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 2/100 ;
U.S. Cl.
CPC ...
G01P 2/100 ;
Abstract

The invention is directed toward a subsurface gravity measurement device and a method for calibrating the same that includes a tilt meter and a gravity sensor. The method includes associating tilt information produced by the gravity sensor as a function of a relationship between tilt information produced by the tilt meter and a correction parameter. The tilt meter produces tilt data, and the gravity meter produces gravity data, corresponding to the tilt data. The tilt data and gravity data is fitted to a polynomial equation that has a plurality of initial coefficients associated therewith. The initial coefficients includes information concerning the correction parameter. The correction parameter is derived as a function of the initial coefficients.


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