The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2004
Filed:
May. 23, 2000
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
A test printing portion with a pattern dimension smaller than a minimum printing pattern dimension is formed on a substrate, and a printing state of this test printing portion is inspected after printing. Based on inspection results of the test printing portion, acceptability of the printing state of the entire substrate is judged. The test printing portion is created on a periphery of the substrate outside the printing pattern area or an unprinted space inside the printing pattern area. A detection device detects the test printing portion, and inspects its printing state. Based on the inspection results, the acceptability of the printing state of the entire substrate is judged. This enables the printing state to be easily inspected at low cost while securing a necessary decree of accuracy.