The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Jun. 12, 2001
Yong Rao, Round Rock, TX (US);
Michael Cerna, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for estimating signal parameters (e.g., frequency, amplitude and/or phase) of one or more tones present in an input signal. Samples of the input signal are received, and a frequency transform of the samples generated. An amplitude peak in the frequency transform corresponding to the tone is identified. Two or more frequency bins are selected proximate to the identified frequency in the transform. A tone frequency value is determined that minimizes a difference between two or more expressions, each including respective numerator and denominator terms corresponding to respective frequency bins and whose ratios each represent a complex amplitude of the tone at a respective bin. Each expressions includes a tone frequency variable that represents a correct tone frequency value of the tone. The correct tone frequency value is determined by computing differences between the expressions for different respective tone frequency variable values, and selecting the value that produces a smallest difference.