The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Apr. 12, 2001
John P. Mugler, III, Charlottesville, VA (US);
Kai Ruppert, Santa Rosa, CA (US);
James R. Brookeman, Charlottesville, VA (US);
University of Virginia Patent Foundation, Charlottesville, VA (US);
Abstract
A method and an apparatus for using hyperpolarized xenon-129 and magnetic resonance imaging or spectroscopy as a probe to non-invasively and non-destructively characterize important properties of certain structures or materials with high spatial and temporal resolution, resulting in high-resolution magnetic resonance images wherein the associated signal intensities reflect a property of interest of at least one of the compartments. Hyperpolarized xenon-129 is introduced into two compartments between which xenon-129 can be exchanged, for example, into the blood vessels of mammal organs and the tissue of said organ or into compartments within inorganic objects. Due to chemical shift and applied magnetic field strength, the hyperpolarized xenon-129 introduced into the first compartment has a different resonant frequency from the hyperpolarized xenon-129 introduced into the second compartment.