The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
May. 29, 2002
Applicant:
Inventors:
Jiang Hsieh, Brookfield, WI (US);
Roy Arnulf Helge Nilsen, Menomonee Falls, WI (US);
Mukta C. Joshi, Natick, MA (US);
Sandeep Dutta, Waukesha, WI (US);
Robert Wolfe, South Milwaukee, WI (US);
John A. Fusco, Waukesha, WI (US);
Ferry Tamtoro, New Berlin, WI (US);
Assignee:
GE Medical Systems Global Technology Company, Waukesha, WI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract
A method for reconstructing an image of an object includes generating a plurality of projection data, helically interpolating the projection data, rebinning the helically interpolated projection data from a fan-beam format to a parallel-beam format, and reconstructing an image of the object using the parallel-beam format projection data.