The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Jan. 20, 2003
Applicant:
Inventor:
John Ling Wing So, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/600 ;
U.S. Cl.
CPC ...
G02B 2/600 ;
Abstract
A method for optical digital signal processing, comprises configuring a plurality of binary mirrors to allow a subset of the binary mirrors to represent a range of values. The plurality of binary mirrors comprise a digital micromirror device. Light from a light source is received at the digital micromirror device. The intensity of the light is altered to represent one of the values based, at least in part, on the configuration of the subset of the binary mirrors. The altered light is transmitted from the digital micromirror device to a detector array.