The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Aug. 13, 2003
Philip J. Wyatt, Santa Barbara, CA (US);
Miles J. Weida, Santa Barbara, CA (US);
Wyatt Technology Corporation, Santa Barbara, CA (US);
Abstract
A method for determining absolute number densities of particles in a solution is disclosed based on a light scattering method. A light scattering photometer is calibrated to produce the Rayleigh ratio at each angle measured with respect to light scattered per unit incident intensity, per unit volume illuminated within the field of view of each detector per steradian subtended by said detector. In order that the numbers calculated be accurate, the illuminated particles should be effectively monodisperse. From the excess Rayleigh ratios measured at a plurality of angles with respect to the incident light beam illuminating said sample particles, an effective size is calculated which, in turn, is used to calculate the differential scattered intensity at each angle. The number of particles per unit volume element is then determined from the measured excess Rayleigh ratio divided by the corresponding differential scattered intensity.