The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2004
Filed:
Nov. 01, 2001
Ulrich Baur, Weil im Schoenbuch, DE;
Otto Andreas Torreiter, Leinfelden-Echt, DE;
Joseph Eckelman, Hopewell Junction, NY (US);
David TinSun Hui, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present invention relates to a test for current leakage of driver/receiver stages, and in particular for bi-directional input/output stages ( ) of a semiconductor chip. Two dedicated support transistor devices ( ) are added into the prior art switching scheme, together with a simple control logic ( ) for selectively controlling the two dedicated support transistor devices according to a predetermined test scheme. An on-chip self-test feature provides valid voltage levels which are convertible by the receiver ( ) to predictable logic states at the evaluation line RDATA. The test can be performed autonomously on the chip without the requirement for an external test device.